2. Advanced analysis

The following examples use MAPIE for discussing more complex risk control problems.

Control the risk of a multi-label classifier

Control the risk of a multi-label classifier

Control risk of a binary classifier with multiple prediction parameters

Control risk of a binary classifier with multiple prediction parameters

Recall control for semantic segmentation

Recall control for semantic segmentation

Precision control for semantic segmentation

Precision control for semantic segmentation

Comparing FWER methods for risk control in binary classification

Comparing FWER methods for risk control in binary classification

Split Fixed Sequence Testing for Precision Control under Multiple Testing

Split Fixed Sequence Testing for Precision Control under Multiple Testing

Control multiple risks of a binary classifier

Control multiple risks of a binary classifier

Risk Control for LLM as a Judge with Abstention

Risk Control for LLM as a Judge with Abstention